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The Trend Micro™ Syslog Content Mapping Guide provides information about log management standards and syntaxes for implementing syslog events in Trend Micro Deep Discovery Inspector.
To enable flexible integration with third-party log management systems, Deep Discovery Inspector supports the following syslog formats:
Log Management System
Description
Common Event Format (CEF)
CEF is an open log management standard created by HP ArcSight.
Deep Discovery Inspector uses a subset of the CEF dictionary.
Log Event Extended Format (LEEF)
LEEF is an event format developed for IBM Security QRadar.
Deep Discovery Inspector uses a subset of the LEEF dictionary.
Trend Micro Event Format (TMEF)
TMEF is a superset of log fields that allow a third-party syslog collector to better control and mitigate detection events provided by Deep Discovery Inspector.