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The Deep Discovery Web Inspector Syslog Content Mapping Guide provides information about log management standards and syntaxes for implementing syslog events in Trend Micro Deep Discovery Web Inspector.
To enable flexible integration with third-party log management systems, Deep Discovery Web Inspector supports the following syslog formats:
Log Management System
Description
Common Event Format (CEF)
CEF is an open log management standard created by HP ArcSight.
Deep Discovery Web Inspector uses a subset of the CEF dictionary.
Log Event Extended Format (LEEF)
LEEF is an event format developed for IBM Security QRadar.
Deep Discovery Web Inspector uses a subset of the LEEF dictionary.
Trend Micro Event Format (TMEF)
TMEF is a superset of log fields that allow a third-party syslog collector to better control and mitigate detection events provided by Deep Discovery Web Inspector.